Abstract:

Abstract:
Nanoscale-resolution imaging is the key metrology method that empowers nanotechnology. The atomic force microscope (AFM) is a very unique scientific instrument to explore material properties at the nanoscale. The most important function of an AFM is to image surface topography. Industry has been using this function for failure analysis and quality control. Research interest has been

Abstract:

Activity-based proteomics – protein and ligand discovery on a global scale