“Imaging Materials Properties at the Nanoscale”

Nanoscale-resolution imaging is the key metrology method that empowers nanotechnology. The atomic force microscope (AFM) is a very unique scientific instrument to explore material properties at the nanoscale. The most important function of an AFM is to image surface topography. Industry has been using this function for failure analysis and quality control. Research interest has been

Chemistry Undergrad Seminar with Prof. Malcolm Forbes

Prof. Malcolm Forbes, the Director of the Center for Photochemical Sciences at Bowling Green State University in Ohio, is visiting UCI and hosting a special undergrad seminar. This is a great opportunity for senior and juniors that are interested in attending graduate school to learn more the Ph.D. Program and speak to Prof. Forbes in a smaller setting. Pizza will be served.


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